QuickWave
software for electromagnetic design
Designed by Janusz Rudnicki
Updated: November 05, 2009
Resonators
The family of dielectric resonators for precise measurements of electromagnetic properties of materials
at microwave frequencies
at microwave frequencies
QWED manufactures several types of resonators (also referred to as test fixtures) for precise measurements of electromagnetic properties of materials at microwave frequencies. Each resonator is equipped with specialised software for extracting the relevant data (typically, complex permittivity or real permittivity and loss tangent) from measurements. The resonators and the accompanying software are based on years of research led by QWED's expert Prof. Jerzy Krupka and documented in dozens of worldwide-appreciated scientific and technical publications. The quality of the resonators has been recognised by industrial practitioners, leading researchers, and industrial standard creators. QWED is especially proud of recognition by Agilent Technologies... read more
Split post dielectric resonators (SPDR)
SPDRs are intended for the measurements of the complex permittivity of laminar dielectric materials including LTCC substrates, but also thin ferroelectric films deposited on low loss dielectric substrates.
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Gallery of split post dielectric resonators
Single post dielectric resonators (SiPDR)
One of the single post dielectric resonators
TE01δ mode dielectric resonator
TE01δ mode dielectric resonator technique is intended for very precise complex permittivity measurements of bulk low loss disc or cylinder shape dielectric ceramics.
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One of the TE01δ dielectric resonators
Award Certificate for Prof. Jerzy Krupka for the invention of Resonators for Precise Measurements of Electromagnetic Properties of Materials at Microwave Frequencies
QWED offers standard reference materials for dielectric measurements. For example, samples of single crystal quartz can be ordered by interested customers, either in conjunction with a resonator purchase or independently. Samples of anisotropic substrates are also available.
Standard reference materials
Diplomas for Prof. Jerzy Krupka
SiPDRs are intended for the measurements of the surface impedance of metamaterials and resistive films as well as for the contact-less measurements of the conductivity of semiconductor wafers. Range of thin film materials that can be measured includes resistive layers, thin metal films and conductive polymer films with the surface resistance Rs < 20 kΩ/square.
